The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2025
Filed:
Sep. 18, 2024
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Manuel Amthor, Jena, DE;
Daniel Haase, Zoellnitz, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/00 (2006.01); G06V 10/80 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/008 (2013.01); G06V 10/80 (2022.01); G06V 10/82 (2022.01);
Abstract
In a computer-implemented method for controlling a microscope, a textual input describing a desired microscope image and an employed sample is received. The textual input and an overview image of the employed sample are input into a large language model, which is trained to process the textual input and the overview image together to calculate microscope settings for capturing a microscope image that corresponds to the desired microscope image. A microscope image is then captured with these calculated microscope settings.