The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 05, 2025

Filed:

Mar. 17, 2022
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Takanori Yamauchi, Tokyo, JP;

Hiroki Goto, Tokyo, JP;

Kiyoshi Onohara, Tokyo, JP;

Naoki Suzuki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/08 (2006.01); G01B 9/02 (2022.01); G01S 7/481 (2006.01); G01S 17/34 (2020.01);
U.S. Cl.
CPC ...
G01S 17/08 (2013.01); G01B 9/02 (2013.01); G01S 7/4817 (2013.01); G01S 17/34 (2020.01);
Abstract

A first optical path length from an emission surface of a first optical system to a reflection surface of a target object is calculated on the basis of first reflected light received by the first optical system and reference light generated by a splitter. A second optical path length from an emission surface of the second optical system to a reflection surface of a reflector is calculated on the basis of second reflected light reflected by the reflector and received by the second optical system and the reference light generated by the splitter A refractive index of a space is calculated on the basis of the second optical path length, and a distance from the emission surface of the first optical system to the reflection surface of the target object is calculated on the basis of the refractive index and the first optical path length.


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