The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Sep. 23, 2021
Intel Corporation, Santa Clara, CA (US);
Maruti Gupta Hyde, Portland, OR (US);
Yi Zhang, Portland, OR (US);
Christian Maciocco, Portland, OR (US);
Alexander Bachmutsky, Sunnyvale, CA (US);
Satish Chandra Jha, Portland, OR (US);
S M Iftekharul Alam, Hillsboro, OR (US);
Nageen Himayat, Fremont, CA (US);
Ravikumar Balakrishnan, Beaverton, OR (US);
Vesh Raj Sharma Banjade, Portland, OR (US);
Kshitij Arun Doshi, Tempe, AZ (US);
Francesc Guim Bernat, Barcelona, ES;
Amar Srivastava, Bangalore, IN;
Srikathyayani Srikanteswara, Portland, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Systems and techniques for cross-layer automated fault tracking and anomaly detection are described herein. Anomaly data may be obtained from a plurality of layers of a network. Elements of the anomaly data may be identified that correspond to a data flow of an application executing on the network. An artificial intelligence model may be trained using the elements of the anomaly data to generate an impact score for the application. The impact score may be generated for the application by evaluating current network metrics using the artificial intelligence model. An operational component of the network may be modified based on the impact score.