The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Aug. 18, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Bambi L Delarosa, Boise, ID (US);

Katya Giannios, Boise, ID (US);

Abhishek Chaurasia, Boise, ID (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01); G06F 17/11 (2006.01); G06N 3/04 (2023.01); G06N 3/06 (2006.01);
U.S. Cl.
CPC ...
G06N 3/06 (2013.01); G06F 17/11 (2013.01); G06N 3/04 (2013.01); G06T 5/70 (2024.01);
Abstract

In some examples, a machine learning model may be trained to denoise an image. In some examples, the machine learning model may identify noise in an image of a sequence based at least in part, on at least one other image of the sequence. In some examples, the machine learning model may include a recurrent neural network. In some examples, the machine learning model may have a modular architecture including one or more building units. In some examples, the machine learning model may have a multi-branch architecture. In some examples, the noise may be identified and removed from the image by an iterative process.


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