The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 29, 2025

Filed:

Jun. 22, 2021
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Gabriele Boschi, San Leonardo In Treponzio (LU), IT;

Srajudheen Makkadayil, Bangalore, IN;

Rekha Manjunath, Karnataka, IN;

Bakshree Mishra, Odisha, IN;

Alessandro Campinoti, Pisa, IT;

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/263 (2006.01); G06F 11/10 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/142 (2013.01); G06F 11/10 (2013.01); G06F 11/1068 (2013.01); G06F 11/263 (2013.01); G06F 2201/82 (2013.01);
Abstract

A fault detector has a processor configured to receive, during a register write event, first data that are to be stored on a first register; determine a first encoded value from the first data using an encoding operation; receive second data from the first register from one or more bit locations on which the first data were to be stored; determine a second encoded value from the second data using the encoding operation; and compare the first encoded value and the second encoded value. If the first encoded value is the same as the second encoded value, the fault detector operates according to a first operational mode; and if the first encoded value is different from the second encoded value, the fault detector operates according to a second operational mode.


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