The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Nov. 03, 2020
Carl Zeiss Microscopy Gmbh, Jena, DE;
Carl Zeiss Microscopy GmbH, , DE;
Abstract
A method for preparing a microscope for imaging a sample. The method includes the following steps: providing the microscope for imaging the sample, wherein the microscope comprises an objective having a motor-adjustable objective correction ring for correcting imaging aberrations; acquiring sample information comprising at least one of the following indications: thickness of a cover glass, material of the cover glass, sample temperature, sample type, sample location on a sample carrier, embedding medium of the sample, or immersion medium; imaging the sample using the microscope for generating at least one raw image of the sample with a first setting of the objective correction ring; and inputting the at least one raw image and the sample information into a machine algorithm and determining a second setting of the objective correction ring, which reduces the imaging aberrations vis à vis the first setting, by means of the algorithm on the basis of the raw image and the sample information.