The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2025
Filed:
Jan. 06, 2022
Fremonta Corporation, Fremont, CA (US);
Eric Wilhelmsen, Fremont, CA (US);
Yongqing Huang, Fremont, CA (US);
Florence Wu, Fremont, CA (US);
Garth Hoffmann, Fremont, CA (US);
Wei Wu, Fremont, CA (US);
Fremonta Corporation, San Jose, CA (US);
Abstract
Sampling probe devices and methods for sampling frozen or solid meltable products are provided herein. Such devices can include a sampling probe with heating element and a cover fabricated at least partly from a microbial sampling medium that fits over the probe and heating element so that when the heated probe is placed against the frozen or solid product, the cover absorbs a liquid sample from the product. Methods of sampling include heating the probe and contacting the product with the cover until sufficient liquid sample is absorbed by the cover. The cover can be weighed after sampling and compared to a before-sampling weight to confirm sufficient liquid was obtained. The sample can be tested as an aggregate sample that is representative of the lot or batch of product being sampled, including testing without an enrichment procedure. Systems utilizing automated heated-sampling plates and radiative heaters are also described.