The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 22, 2025

Filed:

Jan. 26, 2022
Applicant:

Changxin Memory Technologies, Inc., Hefei, CN;

Inventors:

Ting Li, Hefei, CN;

Hou-Hong Chou, Hefei, CN;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/02 (2006.01); H01L 21/311 (2006.01); H01L 23/522 (2006.01); H01L 23/532 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76832 (2013.01); H01L 21/7682 (2013.01); H01L 21/76831 (2013.01); H01L 23/53295 (2013.01); H01L 21/02126 (2013.01); H01L 21/02164 (2013.01); H01L 21/0228 (2013.01); H01L 21/31122 (2013.01); H01L 21/31138 (2013.01); H01L 21/76843 (2013.01); H01L 23/5226 (2013.01);
Abstract

Embodiments of the present application provide a manufacturing method of a semiconductor structure and a semiconductor structure. The manufacturing method includes: providing a base with an electrical contact layer therein; forming an insulating layer on the base, the insulating layer having a through hole penetrating the insulating layer, and the through hole exposing a surface of the electrical contact layer; forming a sidewall layer on a sidewall of the through hole; forming a first isolation layer, the first isolation layer covering a surface of the sidewall layer and an exposed surface of the insulating layer; removing the sidewall layer to form a gap between the first isolation layer and the insulating layer; and forming a conducting layer filling the through hole, the conducting layer being electrically connected to the electrical contact layer.


Find Patent Forward Citations

Li, Ting. (2025). Manufacturing method of semiconductor structure comprising a gap and semiconductor structure comprising a gap (U.S. Patent No. 12368074). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12368074

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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