The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Aug. 08, 2022
Applicant:

Fei Company, Hillsboro, OR (US);

Inventors:

Alexander Henstra, Utrecht, NL;

Ali Mohammadi-Gheidari, Best, NL;

Assignee:

FEI Company, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 37/153 (2006.01);
U.S. Cl.
CPC ...
H01J 37/153 (2013.01); H01J 2237/1534 (2013.01); H01J 2237/28 (2013.01);
Abstract

Optical corrector modules for charged particle columns can include at least one split multipole that includes two multipoles separated by a distance less than 10 mm. Each of the individual multipoles may include at least two electrodes positioned to partially define a beam path through the multipole. Each of the electrodes can include a first surface that faces upstream of a charged particle beam when used in the charged particle column and a second surface that faces downstream of the charged particle beam when used in the charged particle column. The thickness between the first surface and the second surface for each of the electrodes may be less than 10 mm. The split multipoles may be electrostatic and may correspond to hexapoles.


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