The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Mar. 31, 2023
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Srdjan Malisic, San Jose, CA (US);

Chi Yuan, San Jose, CA (US);

Jenny Chen, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/22 (2006.01); G06F 11/263 (2006.01); G06F 11/27 (2006.01); G06F 11/273 (2006.01); G06F 21/53 (2013.01);
U.S. Cl.
CPC ...
G06F 11/2273 (2013.01); G06F 11/2205 (2013.01); G06F 11/263 (2013.01); G06F 11/27 (2013.01); G06F 11/2733 (2013.01); G06F 21/53 (2013.01); G06F 2221/034 (2013.01);
Abstract

Efficient and effective testing systems and methods are presented. In one embodiment, a testing system includes: a user interface configured to enable user interaction with the system; a test board configured to communicatively couple with a plurality of devices under test (DUTs), wherein the DUTs are compute express link (CXL) protocol compliant; and a tester configured to direct testing of the plurality of DUTs, wherein the tester manages testing of the plurality of DUTs, including managing CXL protocol aspects of the testing. In one exemplary implementation, the tester prevents testing of a first one of the plurality of DUTs from detrimentally interfering with testing of a second one of the plurality of DUTs.


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