The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Dec. 19, 2022
Applicant:

Mediatek Inc., Hsinchu, TW;

Inventors:

Po-Chao Tsao, Hsinchu, TW;

Hsien-Hsin Lin, Hsinchu, TW;

Assignee:

MEDIATEK INC., Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/48 (2006.01); H01L 21/02 (2006.01); H01L 21/04 (2006.01); H01L 21/762 (2006.01); H01L 21/768 (2006.01); H10D 62/13 (2025.01);
U.S. Cl.
CPC ...
H01L 21/481 (2013.01); H01L 21/02293 (2013.01); H01L 21/02362 (2013.01); H01L 21/045 (2013.01); H01L 21/76243 (2013.01); H01L 21/76814 (2013.01); H01L 21/76829 (2013.01); H10D 62/151 (2025.01);
Abstract

A semiconductor structure is provided. The semiconductor structure includes an insulator layer, first and second field-effect transistor devices, an isolation field-effect transistor device, front-side gate and back-side gate contacts. Each of the first and second field-effect transistor devices and the isolation field-effect transistor device includes a fin structure and first and second epitaxial source/drain structures. The fin structure includes channel layers and a gate structure that is wrapped around the channel layers. The first and second epitaxial source/drain structures are connected to opposite sides of the channel layers. The isolation field-effect transistor device is kept in the off-state. The front-side gate contact is formed on the first field-effect transistor device and electrically connected to the gate structure of the first field-effect transistor device. The back-side gate contact is formed passing through the insulator layer and electrically connected to the gate structure of the isolation field-effect transistor device.


Find Patent Forward Citations

Loading…