The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Mar. 31, 2023
Advantest Corporation, Tokyo, JP;
Srdjan Malisic, San Jose, CA (US);
Chi Yuan, San Jose, CA (US);
Rebecca Qiu, San Jose, CA (US);
Jenny Chen, San Jose, CA (US);
Advantest Corporation, Tokyo, JP;
Abstract
Efficient and effective testing systems and methods are presented. In one embodiment, a system includes: a user interface configured to enable user interaction with the system; a test board configured to communicatively couple with a plurality of devices under test (DUTs), wherein the DUTs are compute express link (CXL) protocol compliant; and a tester configured to direct testing of the plurality of DUTs, wherein the tester is configured to enable hot add of one of the plurality of DUTs without interfering with testing of the other DUTS. In one exemplary implementation, the DUTs are memory devices and the DUTs can operate as extended memory. An added DUT can be automatically recognized by a host in a way that is transparent to users (e.g., BIOS can direct detection of characteristics of an added DUT, etc.). The tester automatically can direct the hot add in response to a user trigger.