The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Aug. 31, 2021
Applicant:

Abberior Instruments Gmbh, Goettingen, DE;

Inventors:

Benjamin Harke, Goettingen, DE;

Lars Kastrup, Goettingen, DE;

Assignee:

ABBERIOR INSTRUMENTS GMBH, Goettingen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); F21V 8/00 (2006.01); G02B 21/02 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 6/0008 (2013.01); G02B 21/025 (2013.01); G02B 26/0833 (2013.01);
Abstract

A method for punctiform illumination of a sample with a MINFLUX microscope has the sample being sequentially illuminated at illumination points of a predefined or predefinable illumination point pattern. The lateral extent of the illumination point pattern is smaller than the longest wavelength of the illumination light. The illumination points are always illuminated exclusively with a time offset. A distinct individual light source is assigned to each illumination point of the illumination point pattern. Each illumination point is illuminated by the focus of an illumination light bundle of the individual light source.


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