The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Oct. 12, 2023
Applicant:

University of Washington Through Its Center for Commercialization, Seattle, WA (US);

Inventors:

Jens Gundlach, Seattle, WA (US);

Ian M. Derrington, Seattle, WA (US);

Andrew Laszlo, Seattle, WA (US);

Elizabeth Manrao, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/487 (2006.01); C12Q 1/6869 (2018.01); G01N 27/447 (2006.01);
U.S. Cl.
CPC ...
G01N 33/48721 (2013.01); C12Q 1/6869 (2013.01); G01N 27/447 (2013.01);
Abstract

The present disclosure generally relates to the methods and compositions to efficiently analyze polymer characteristics using nanopore-based assays. Specifically disclosed is a method for generating reference signals for polymer analysis in a nanopore system, wherein the nanopore system has a multi-subunit output signal resolution. The method comprises translocating a reference sequence through a nanopore to generate a plurality of reference output signals, wherein each possible multi-subunit sequence that can determine an output signal appears only once in the reference sequence. The output signals are compiled into a reference map for nanopore analysis of an analyte polymer. Also provided are methods and compositions for calibrating the nanopore system for optimized polymer analysis.


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