The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2025

Filed:

Jul. 11, 2022
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Masashi Oota, Atsugi, JP;

Noritaka Ishihara, Koza, JP;

Motoki Nakashima, Atsugi, JP;

Yoichi Kurosawa, Atsugi, JP;

Shunpei Yamazaki, Setagaya, JP;

Yasuharu Hosaka, Tochigi, JP;

Toshimitsu Obonai, Shimotsuke, JP;

Junichi Koezuka, Tochigi, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H10D 86/01 (2025.01); H01L 21/02 (2006.01); H01L 21/425 (2006.01); H01L 21/477 (2006.01); H10D 1/47 (2025.01); H10D 1/68 (2025.01); H10D 30/67 (2025.01); H10D 86/40 (2025.01); H10D 86/60 (2025.01); H10D 99/00 (2025.01);
U.S. Cl.
CPC ...
H10D 86/0221 (2025.01); H01L 21/0242 (2013.01); H01L 21/02422 (2013.01); H01L 21/02554 (2013.01); H01L 21/02565 (2013.01); H01L 21/0262 (2013.01); H01L 21/02631 (2013.01); H01L 21/425 (2013.01); H01L 21/477 (2013.01); H10D 1/47 (2025.01); H10D 1/692 (2025.01); H10D 30/6755 (2025.01); H10D 30/6756 (2025.01); H10D 86/423 (2025.01); H10D 86/481 (2025.01); H10D 86/60 (2025.01); H10D 99/00 (2025.01);
Abstract

To provide a method for manufacturing a semiconductor device including an oxide semiconductor film having conductivity, or a method for manufacturing a semiconductor device including an oxide semiconductor film having a light-transmitting property and conductivity. The method for manufacturing a semiconductor device includes the steps of forming an oxide semiconductor film over a first insulating film, performing first heat treatment in an atmosphere where oxygen contained in the oxide semiconductor film is released, and performing second heat treatment in a hydrogen-containing atmosphere, so that an oxide semiconductor film having conductivity is formed.


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