The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Mar. 22, 2024
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventor:
Luca Bert, San Jose, CA (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 3/06 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0689 (2013.01); G06F 3/0604 (2013.01); G06F 3/0655 (2013.01); G06F 11/1032 (2013.01); G06F 11/1076 (2013.01); G06F 11/108 (2013.01);
Abstract
Aspects of the present disclosure configure a system component, such as memory sub-system controller, to dynamically generate Redundant Array of Independent Nodes (RAIN) parity information for zone-based memory allocations. The RAIN parity information is generated for a given zone or set of zones on the basis of whether the given zone or set of zones satisfy a zone completeness criterion. The zone completeness criterion can represent a specified size such that when a given zone reaches the specified size, the parity information for that zone is generated.