The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Nov. 19, 2021
Nearfield Instruments B.v., Rotterdam, NL;
Nearfield Instruments B.V., Rotterdam, NL;
Abstract
An alignment system and method for aligning an object (O) having an object marker. An image of the object marker is projected onto an imaging sensor () having sensor elements. At least one reference marker is projected onto the imaging sensor (). Based on image output () from the imaging sensor (), respective subsets of sensor elements are determined. Based on a first subset of the sensor elements, a marker position is determined where the image of the object marker is projected onto the imaging sensor (). Based on a second subset (Sr) of the sensor elements, a reference position is determined where the reference marker is projected onto the imaging sensor (). The marker position correlates with a position (Xm,Ym) of the object (O) whereas the reference position does not. The object position (Xm,Ym) is determined based on the marker position relative to the reference position.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile