The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Sep. 21, 2023
Applicant:
Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;
Inventors:
Chuan-Hsiang Sun, Taoyuan, TW;
Bo-You Chen, Hsinchu, TW;
Chi-Chang Lai, Taichung, TW;
Hsiou-Yu He, Hsinchu, TW;
Peiwei Lin, Hsinchu, TW;
Assignee:
Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/02 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 1/44 (2006.01); G01R 31/00 (2006.01); G01R 31/20 (2006.01); G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 31/2889 (2013.01); G01R 1/06772 (2013.01);
Abstract
An apparatus for probing a device-under-test (DUT) includes a fixture, a circuitry film attached to the fixture, a probing tip disposed on and electrically coupled to the circuitry film to probe a device-under-test, and a first signal connector disposed on the circuitry film and electrically coupled to the probing tip through the circuitry film. The first signal connector is oriented in a direction that is angularly offset from a lengthwise direction of the probing tip.