The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2025
Filed:
Oct. 28, 2022
Tektronix, Inc., Beaverton, OR (US);
Vivek Shivaram, Bangalore, IN;
Niranjan R Hegde, Siddapur, IN;
Parjanya Adiga, Bengaluru, IN;
Krishna N H Sri, Bengaluru, IN;
Tsuyoshi Miyazaki, Kawaguchi, JP;
Yogesh M. Pai, Bengaluru, IN;
Venkatraj Melinamane, Bangalore, IN;
Tektronix, Inc., Beaverton, OR (US);
Abstract
A test and measurement instrument has a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to: receive waveform data from the DUT, locate one or more reverse recovery regions in the waveform data, determine a reverse recovery time for the DUT from the reverse recovery region, and display a reverse recovery plot of the one or more reverse recovery regions on the user interface. A method of providing reverse recovery measurements for a device under test (DUT) includes receiving waveform data through one or more probes from the DUT, locating one or more reverse recovery regions in the waveform data, determining a reverse recovery time for the DUT for the one or more reverse recovery regions, and displaying a reverse recovery plot of the one or more reverse recovery regions on the user interface.