The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2025
Filed:
Oct. 05, 2021
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Manuel Amthor, Jena, DE;
Daniel Haase, Zöllnitz, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06F 18/214 (2023.01); G06T 7/0002 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30168 (2013.01);
Abstract
A microscopy system comprises a microscope configured to capture raw data and a computing device configured to derive at least one microscope image from the raw data and to run a processing program for processing the microscope image. The computing device is configured to first supply a microscope image which is to be processed with the processing program to a checking program, which checks the supplied microscope image with respect to an evaluation criterion predefined for the processing program. The microscope image is only transmitted to the processing program in the event of a positive checking result.