The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

Nov. 28, 2022
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventors:

Subhankar Ghose, Bengaluru, IN;

Ankit Dash, Bengaluru, IN;

David M. Bouse, Camas, WA (US);

Pradeep Joshi, Bengaluru, IN;

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/34 (2006.01); G01R 19/25 (2006.01); G01R 31/28 (2006.01); G01R 31/317 (2006.01); G01R 31/3187 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 13/34 (2013.01); G01R 19/2509 (2013.01);
Abstract

A method of automatically selecting a continuous time linear equalization (CTLE) filter includes capturing a response waveform for a channel of a communication link of a device under test (DUT), generating a set of candidate CTLEs, and automatically selecting the CTLE from the set of candidate CTLEs using the response waveform. A test and measurement instrument has a user interface, a port to allow the instrument to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: generate a set of CTLE candidates; capture a response waveform for the channel; and automatically select the CTLE from the set of candidate CTLEs using the response waveform.


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