The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2025

Filed:

Feb. 16, 2024
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Cheng-Kang Hu, Kaohsiung, TW;

Shou-Wen Kuo, Hsinchu, TW;

Sheng-Hsiang Chuang, Hsin-Chu, TW;

Jiun-Rong Pai, Jhubei, TW;

Hsu-Shui Liu, Pingjhen, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); G01M 3/38 (2006.01); H01L 21/677 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67265 (2013.01); G01M 3/38 (2013.01); H01L 21/67259 (2013.01); H01L 21/67288 (2013.01); H01L 21/67772 (2013.01);
Abstract

An apparatus for inspecting wafer carriers is disclosed. In one example, the apparatus includes: a housing; a load port; a robot arm inside the housing; and a processor. The load port is configured to load a wafer carrier into the housing. The robot arm is configured to move a first camera connected to the robot arm. The first camera is configured to capture a plurality of images of the wafer carrier. The processor is configured to process the plurality of images to inspect the wafer carrier.


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