The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Jul. 05, 2022
Applicant:
Changxin Memory Technologies, Inc., Hefei, CN;
Inventors:
Assignee:
CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/08 (2006.01); G11C 8/08 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/08 (2013.01); G11C 8/08 (2013.01); G11C 2029/1202 (2013.01); G11C 2029/1204 (2013.01);
Abstract
A method and device for testing a memory are provided. The method includes the following operations. After activating at least one word line, at least two times of read operations are performed on a to-be-tested memory cell connected to the activated word line. Whether there is a read abnormality in the to-be-tested memory cell is determined according to an output signal obtained after the at least two times of read operations.
Liu, Dong. (2025). Method and device for testing memory (U.S. Patent No. 12334167). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12334167
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile