The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2025
Filed:
Oct. 05, 2021
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/26 (2006.01); G02B 21/33 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/26 (2013.01); G02B 21/33 (2013.01); G02B 21/361 (2013.01); G06T 2207/10056 (2013.01);
Abstract
A microscopy system comprises a microscope with an overview camera for capturing at least one overview image of a sample carrier designed to receive at least one sample fluid; and a computing device configured to determine at least one sample image area of the at least one sample fluid within the at least one overview image. The computing device comprises an evaluation program into which a determined sample image area is entered and which is configured to determine a fluid state of the associated sample fluid based on the sample image area.