The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Apr. 25, 2022
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Nicolas Louis Breil, San Jose, CA (US);

Byeong Chan Lee, San Jose, CA (US);

Benjamin Colombeau, Santa Clara, CA (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/285 (2006.01); H01L 21/768 (2006.01); H01L 23/522 (2006.01); H10D 30/01 (2025.01); H10D 30/62 (2025.01); H10D 30/67 (2025.01); H10D 64/01 (2025.01); H10D 64/23 (2025.01); H10D 84/01 (2025.01); H10D 84/03 (2025.01); H01L 21/02 (2006.01); H01L 21/3213 (2006.01); H10D 62/10 (2025.01);
U.S. Cl.
CPC ...
H01L 21/76877 (2013.01); H01L 21/28518 (2013.01); H01L 21/28556 (2013.01); H01L 21/28562 (2013.01); H01L 21/76843 (2013.01); H01L 21/76897 (2013.01); H01L 23/5226 (2013.01); H10D 30/031 (2025.01); H10D 30/6219 (2025.01); H10D 30/6729 (2025.01); H10D 64/01 (2025.01); H10D 64/251 (2025.01); H10D 84/013 (2025.01); H10D 84/038 (2025.01); H01L 21/02647 (2013.01); H01L 21/32135 (2013.01); H01L 21/76841 (2013.01); H01L 21/76879 (2013.01); H01L 21/76883 (2013.01); H10D 30/6713 (2025.01); H10D 30/6735 (2025.01); H10D 30/6737 (2025.01); H10D 30/6743 (2025.01); H10D 30/6757 (2025.01); H10D 62/115 (2025.01);
Abstract

A method of forming a contact trench structure in a semiconductor device, the method includes performing a first selective deposition process to form a contact on sidewalls of a trench, each of the sidewalls of the trench comprising a first cross section of a first material and a second cross section of a second material, performing a second selective deposition process to form a metal silicide layer on the contact, performing a first metal fill process to form a contact plug within the trench, the first metal fill process including depositing a contact plug metal material within the trench, performing an etch process to form an opening within the trench, comprising partially etching the contact plug metal material within the trench, and performing a second metal fill process, the second metal fill process comprising depositing the contact plug metal material within the opening.


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