The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2025

Filed:

Dec. 10, 2021
Applicant:

Fasford Technology Co., Ltd., Minami-Alps, JP;

Inventors:

Hideharu Kobashi, Minami-Alps, JP;

Masayuki Mochizuki, Minami-Alps, JP;

Assignee:

Fasford Technology Co., Ltd., Minami-Alps, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); G06T 7/00 (2017.01); G06T 7/73 (2017.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
H01L 21/67092 (2013.01); G06T 7/001 (2013.01); G06T 7/74 (2017.01); H01L 21/67259 (2013.01); H04N 23/56 (2023.01); H04N 23/90 (2023.01); G06T 2207/30148 (2013.01);
Abstract

A die bonding apparatus includes a control device for controlling an imaging device. The control device is configured to: detect the dicing grooves by photographing the wafer using the imaging device; roughly determine a central position of the die by calculating the center coordinate of the die on the basis of the detected dicing grooves; move a center of the die to a center of an optical axis of the imaging device on the basis of the center coordinate; photograph the moved die by the imaging device and detect positions of pads possessed by the die on the basis of an image of the photographed die; detect a specific pad arrangement having a unique pitch on the basis of the detected dispositions of the pads; and register the detected specific pad arrangement as a template model.


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