The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
Aug. 24, 2023
Synopsys, Inc., Sunnyvale, CA (US);
Abdelrahman G. Qoutb, Beaverton, OR (US);
Eby G. Friedman, Rochester, NY (US);
Robert E. Freeman, Menlo Park, CA (US);
Jamil Kawa, Campbell, CA (US);
Stephen Robert Whiteley, Sunnyvale, CA (US);
Synopsys, Inc., Sunnyvale, CA (US);
Abstract
On-chip testing of a superconductive integrated circuit device includes receiving a superconductive circuit design having superconductive logic elements. Further, a first testability characteristic for first test circuitry at a first node within the superconductive circuit design is determined. The first testability characteristic corresponds to one or more of a test generation control level and a test observability control level. An updated superconductive circuit design from the superconductive circuit design is generated based on the first testability characteristic for the first test circuitry. The superconductive circuit design includes the first test circuitry at the first node.