The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
Feb. 11, 2021
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Volker Doering, Jena, DE;
Andreas Seher, Jena, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/27 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/278 (2013.01); G01N 21/6458 (2013.01);
Abstract
A reference sample for calibrating and/or adjusting a microscope and to uses of the reference sample. The latter has at least one carrier structure made of a carrier material which, at least in regions of its extent, is excitable to emit luminescence light, and at least one two-dimensional and/or three-dimensional structure consisting of a number of substructures. The carrier material is diamond or silicon carbide and is doped in or around the regions of the two-dimensional and/or three-dimensional structure in order to be excitable to emit the luminescence light.