The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 27, 2025

Filed:

Feb. 04, 2022
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Frank Hensel, Böblingen, DE;

Olaf Pöppe, Tübingen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/56 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G11C 29/56 (2013.01); G01R 31/31905 (2013.01); G11C 2029/5602 (2013.01);
Abstract

The automated test equipment is configured to establish communication, e.g. by uploading a program to the DUT using a first interface, such as a debug interface or a generic interface having access to the processing unit for external control. A typical use case of the first interface is debug access to the DUT, which typically requires limited data rates. In the case of the invention the first interface is an ATE access for test execution. The first interface configures the DUT to open a second interface running at much higher data rate, which is higher than the first interface, for additional communication. Additionally, the second interface may have extended capabilities compared to the first interface, such as presenting its own memory to the processing unit of the DUT as a normal system memory.


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