The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Feb. 25, 2022
Carl Zeiss Microscopy Gmbh, Jena, DE;
Manuel Amthor, Jena, DE;
Daniel Haase, Zöllnitz, DE;
Thomas Kalkbrenner, Jena, DE;
Jörg Siebenmorgen, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method for light sheet microscope examination of a specimen, the specimen being illuminated with a light sheet by an illumination objective, and a light sheet microscope for performing the method. Light emitted by the specimen is imaged onto an area-type detector by a detection objective. An optical axis of the detection objective encloses with an optical axis of the illumination objective an angle that differs from 0° and from 180° and intersects the light sheet in a light sheet plane. The area-type detector records an image. A neural network analyzes the image to determine whether the light sheet plane is located in a focal plane of the detection objective, and/or in which direction along the optical axis the light sheet plane is located from the focal plane, and/or at what distance, measured along the optical axis of the detection objective, the light sheet plane is from the focal plane.