The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Apr. 28, 2021
Applicants:

Kabushiki Kaisha N-tech, Gifu-ken, JP;

Kabushiki Kaisha Yakult Honsha, Tokyo, JP;

Tohoshoji Kabushiki Kaisha, Osaka, JP;

Inventors:

Shenglan Li, Gifu-Ken, JP;

Kazumi Banno, Gifu-Ken, JP;

Masaki Nagase, Gifu-Ken, JP;

Hideki Ota, Tokyo, JP;

Kunimitsu Toyoshima, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06V 30/19 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/11 (2017.01); G06V 30/1904 (2022.01); G06V 30/19093 (2022.01); G06T 2207/20021 (2013.01); G06T 2207/30144 (2013.01);
Abstract

A print inspection device includes a camera that captures a character printed on an inspection target, a shape matching processor, a deformation pattern generator, and an inspection processor. The shape matching processor checks a shape of a captured character pattern included in a captured image obtained by the camera against a shape of a preset reference character pattern while changing a deformation degree of the shape of the reference character pattern and searches for a matched character. The deformation pattern generator generates a deformed character pattern obtained by deforming the reference character pattern at the deformation degree to which the character is matched in the shape matching process. The inspection processor inspects whether a printed state of the character is satisfactory from a result of the comparison between the deformed character pattern and the captured character pattern.


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