The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Sep. 06, 2022
Synopsys, Inc., Mountain View, CA (US);
Chia-Wei Liang, Saratoga, CA (US);
Wenxin Wang, Sunnyvale, CA (US);
Meng-Tse Chen, Zhubei, TW;
Goichiro Ono, San Jose, CA (US);
Zhe Zhao, Shanghai, CN;
Yang Song, Santa Clara, CA (US);
Yu Sui, Sunnyvale, CA (US);
Yuchen Xu, San Jose, CA (US);
Synopsys, Inc., Sunnyvale, CA (US);
Abstract
An emulation system traverses trace buffers to read data captured from a design under test (DUT). The emulation system receives a request to read at least a portion of DUT data. The emulation system reads a header of the latest sample of the DUT data, where header of each sample of the DUT data includes one or more pointers to a previously stored sample. The samples of the DUT data are partitioned into frames and sectors. The emulation system can identify samples of the DUT data using the pointers in the header of the samples and compare time stamps of the samples against a specified time stamp in the received request. After identifying a sample having the specified time stamp, the emulation system may read the sample for output to the user (e.g., reconstructing a waveform using the sample).