The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Jan. 11, 2024
Applicant:
Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;
Inventors:
Hsieh-Hung Hsieh, Taipei, TW;
Wu-Chen Lin, Hsinchu, TW;
Yen-Jen Chen, Taipei, TW;
Tzu-Jin Yeh, Hsinchu, TW;
Assignee:
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD., Hsinchu, TW;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/40 (2020.01); G01R 29/08 (2006.01); H03F 3/21 (2006.01); H03F 3/24 (2006.01);
U.S. Cl.
CPC ...
G01R 31/40 (2013.01); G01R 29/0871 (2013.01); H03F 3/211 (2013.01); H03F 3/245 (2013.01); H03F 2200/267 (2013.01); H03F 2200/451 (2013.01);
Abstract
A testing system includes: a dividing circuit configured to receive a testing signal and provide a plurality of input signals according to the testing signal; and a plurality of integrated power-amplifiers coupled to the dividing circuit, each of the plurality of integrated power-amplifiers being configured to be tested by receiving a respective input signal of the plurality of input signals and generating a respective output signal for a predetermined testing time.