The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Aug. 23, 2022
Applicant:

Nikon Corporation, Tokyo, JP;

Inventor:

Michael Birk Binnard, Belmont, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B22F 10/36 (2021.01); B22F 12/37 (2021.01); B22F 12/41 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01);
U.S. Cl.
CPC ...
B22F 10/36 (2021.01); B22F 12/37 (2021.01); B22F 12/41 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B22F 2203/00 (2013.01);
Abstract

A processing machine () for building an object () from a material () includes a build platform (), a platform mover assembly (), a material supply (), an irradiation device (), and an analyzer system (). The platform mover assembly () moves the build platform () about a platform movement axis (X) and along the platform movement axis (X). The material supply () supplies material () to build the object () on the build platform (). The irradiation device () irradiates at least a portion of the material () with an energy beam (A) to form the object () from the material () on the build platform (). The analyzer system () is configured to monitor the energy beam (A). The analyzer system () includes an alignment component () that rotates concurrently with the build platform () about the platform movement axis (X), but that is inhibited from moving concurrently with the build platform () along the platform movement axis (X).


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