The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Jun. 12, 2023
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Roland Rupp, Lauf, DE;

Ronny Kern, Villach, AT;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/16 (2006.01); G06N 3/126 (2023.01); H01L 21/02 (2006.01); H01L 21/04 (2006.01); H01L 21/265 (2006.01); H01L 21/268 (2006.01); H01L 21/304 (2006.01); H01L 21/78 (2006.01); H01L 29/06 (2006.01); H01L 29/66 (2006.01); H01L 29/739 (2006.01); H01L 29/78 (2006.01); H01L 29/872 (2006.01); H10D 8/01 (2025.01); H10D 12/01 (2025.01); H10D 62/10 (2025.01); H10D 62/832 (2025.01); H10D 8/60 (2025.01); H10D 12/00 (2025.01); H10D 30/63 (2025.01);
U.S. Cl.
CPC ...
H10D 62/8325 (2025.01); G06N 3/126 (2013.01); H01L 21/02378 (2013.01); H01L 21/02529 (2013.01); H01L 21/02694 (2013.01); H01L 21/046 (2013.01); H01L 21/268 (2013.01); H01L 21/304 (2013.01); H01L 21/7813 (2013.01); H10D 8/051 (2025.01); H10D 12/031 (2025.01); H10D 62/105 (2025.01); H01L 21/26506 (2013.01); H10D 8/60 (2025.01); H10D 12/441 (2025.01); H10D 30/63 (2025.01);
Abstract

A method for producing a silicon carbide component includes forming a silicon carbide layer on an initial wafer, wherein the silicon carbide layer comprises a doping region to be produced, forming an electrically conductive contact structure on the surface of the silicon carbide layer, the electrically conductive contact structure, producing a splitting region by pre-damaging the splitting region, wherein the splitting region is produced by laser treating the splitting region before forming the electrically conductive contact, splitting the silicon carbide layer or the initial wafer along the splitting region such that a silicon carbide substrate of the silicon carbide component to be produced is split off, wherein the silicon carbide substrate has a thickness of more than 30 μm, wherein the doping region extends to a surface of the silicon carbide layer before splitting the silicon carbide layer, and wherein splitting along comprises applying a polymer film.


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