The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Apr. 30, 2023
Applicant:

Tektronix, Inc., Beaverton, OR (US);

Inventor:

Kan Tan, Portland, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H04L 25/03 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0058 (2013.01); H04L 25/03038 (2013.01);
Abstract

A test and measurement instrument has one or more input ports to connect the instrument to a device under test (DUT), one or more processors configured to execute code to cause the one or more processors to: receive an equalized waveform and an un-equalized waveform through the input port from the DUT, without any knowledge of a digital pattern that corresponds to the waveforms and without extracting the digital pattern from the waveforms, align the un-equalized waveform and the equalized waveform in time to produce an aligned un-equalized waveform and an aligned equalized waveform, and use the aligned equalized waveform and the aligned un-equalized waveform to determine equalizer tap values.


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