The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 13, 2025

Filed:

Jan. 25, 2023
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Scott E. Sills, Boise, ID (US);

Durai Vishak Nirmal Ramaswamy, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 29/40 (2006.01); H01L 29/51 (2006.01); H01L 29/78 (2006.01); H10B 12/00 (2023.01); H10B 53/10 (2023.01); H10B 53/20 (2023.01); H10B 53/30 (2023.01); H01L 29/24 (2006.01); H10B 53/40 (2023.01);
U.S. Cl.
CPC ...
H01L 29/513 (2013.01); H01L 29/408 (2013.01); H01L 29/516 (2013.01); H01L 29/7827 (2013.01); H10B 12/31 (2023.02); H10B 53/10 (2023.02); H10B 53/20 (2023.02); H10B 53/30 (2023.02); H01L 29/24 (2013.01); H01L 29/517 (2013.01); H01L 29/518 (2013.01); H01L 29/78391 (2014.09); H10B 12/50 (2023.02); H10B 53/40 (2023.02);
Abstract

Some embodiments include integrated memory having an array of access transistors. Each access transistor includes an active region which has a first source/drain region, a second source/drain region and a channel region. The active regions of the access transistors include semiconductor material having elements selected from Groups 13 and 16 of the periodic table. First conductive structures extend along rows of the array and have gating segments adjacent the channel regions of the access transistors. Heterogenous insulative regions are between the gating segments and the channel regions. Second conductive structures extend along columns of the array, and are electrically coupled with the first source/drain regions. Storage-elements are electrically coupled with the second source/drain regions. Some embodiments include a transistor having a semiconductor oxide channel material. A conductive gate material is adjacent to the channel material. A heterogenous insulative region is between the gate material and the channel material.


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