The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Apr. 14, 2022
Applicant:
Kla Corporation, Milpitas, CA (US);
Inventors:
Aditya Gulati, Chandigarh, IN;
Raghavan Konuru, Andhra Pradesh, IN;
Niveditha Lakshmi Narasimhan, Chennai, IN;
Saravanan Paramasivam, Chennai, IN;
Martin Plihal, Pleasanton, CA (US);
Prasanti Uppaluri, Saratoga, CA (US);
Assignee:
KLA Corporation, Milpitas, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 5/50 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 5/50 (2013.01); G06T 7/001 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20224 (2013.01); G06T 2207/30148 (2013.01);
Abstract
Methods and systems for determining information for a specimen are provided. One system includes a computer subsystem and one or more components executed by the computer subsystem. The one or more components include a deep learning model configured for denoising an image of a specimen generated by an imaging subsystem. The computer subsystem is configured for determining information for the specimen from the denoised image.