The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Jun. 01, 2022
Meta Platforms Technologies, Llc, Menlo Park, CA (US);
Richard Farrell, Seattle, WA (US);
Siddharth Buddhiraju, Palo Alto, CA (US);
Jilin Yang, Redmond, WA (US);
Pasqual Rivera, Woodinville, WA (US);
Anneli Munkholm, Wailea, HI (US);
Keith Rozenburg, Bellevue, WA (US);
Meta Platforms Technologies, LLC, Menlo Park, CA (US);
Abstract
Disclosed herein are techniques for waveguide displays. According to some embodiments, a method for fabricating a multi-layer optical device comprising includes measuring thickness variations within a target area of a first substrate for fabricating a first optical element of the multi-layer optical device and determining, based on the measuring, a thickness correction map indicating amounts of material to be removed in different regions of the target area to planarize the target area. The method also includes planarizing the target area of the first substrate based on the thickness correction map and bonding the first substrate to a second substrate that comprises a second optical element fabricated thereon to form a layer stack, wherein the target area of the first substrate aligns with and is bonded to the second optical element to form a multi-layer structure. The method further includes singulating the multi-layer structure from the layer stack.