The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Dec. 04, 2019
Leica Microsystems Cms Gmbh, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A method for automatically determining a plurality of positions in a sample arrangement in the object space of a microscope that includes a microscope objective defining an optical axis is provided. A measurement beam is generated by a measurement beam device and directed at the sample arrangement, and a measurement beam reflected by the sample arrangement is detected by a detector, which produces an output signal. The sample arrangement is displaced in at least one direction perpendicular to the optical axis. The plurality of positions in the sample arrangement is determined on the basis of the displacement by means of output signals of the detector generated during the displacement in the at least one direction.