The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Apr. 12, 2022
Carl Zeiss Microscopy Gmbh, Jena, DE;
Daniel Schwedt, Jena, DE;
Tiemo Anhut, Jena, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
A device and a method for multi-spot scanning microscopy using a segmented color separator are disclosed, wherein a beam splitter is segmented laterally to a surface normal of the beam splitter into at least two filter fields for the selection of wavelength ranges and/or polarization directions. Individual partial illumination beams are thus each guided in an illumination beam path into a light spot on or in a simple to be examined and scanned over it. Detection light, which the sample emits in partial detection means after irradiation using the individual partial illumination beams, is guided onto a detection unit and detected thereby, wherein the partial illumination beams and/or the partial detection beams are each selected according to wavelength ranges and/or polarization directions by means of the beam splitter segmented laterally to a surface normal.