The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 13, 2025
Filed:
Nov. 01, 2021
Carl Zeiss Microscopy Gmbh, Jena, DE;
Tiemo Anhut, Jena, DE;
Daniel Schwedt, Jena, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
An apparatus includes a detection beam path, along which detection radiation is guided, and a means for splitting the detection radiation between first and second detection paths, with a detector being in each detection path. A microlens array is arranged upstream of at least one detector. The first detector has a first spatial resolution, and the second detector has a second spatial resolution that is lower than the first spatial resolution. Also, the first detector has a first temporal resolution, and the second detector has a second temporal resolution that is higher than the first temporal resolution. Captured image data and computationally combined to form a three-dimensionally resolved resulting image.