The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Sep. 13, 2022
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
William Yu, Boise, ID (US);
Daniele Balluchi, Cernusco Sul Naviglio, IT;
Chad B. Erickson, Boise, ID (US);
Danilo Caraccio, Milan, IT;
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2005.12); G11C 29/10 (2005.12); G11C 29/12 (2005.12); G11C 29/38 (2005.12);
U.S. Cl.
CPC ...
G11C 29/38 (2012.12); G11C 29/10 (2012.12); G11C 29/1201 (2012.12);
Abstract
Methods, systems, and devices related to built-in self-test burst patterns based on architecture of memory. A controller can be coupled to a memory device. The controller can include built-in self-test (BIST) circuitry. The BIST circuitry can include registers configured to store respective write burst patterns and read burst patterns based on an architecture of the memory device.