The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Oct. 17, 2023
Applicant:

Center for Deep Learning IN Electronics Manufacturing, Inc., San Jose, CA (US);

Inventors:

Suhas Pillai, San Jose, CA (US);

Thang Nguyen, San Jose, CA (US);

Ajay Baranwal, Dublin, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/30 (2019.12); G03F 7/00 (2005.12); G06F 30/398 (2019.12); G06N 3/045 (2022.12);
U.S. Cl.
CPC ...
G06F 30/398 (2019.12); G03F 7/705 (2012.12); G06N 3/045 (2022.12);
Abstract

Methods and systems for generation of shape data for a set of electronic designs include inputting a set of shape data, where the set of shape data represents a set of shapes for a device fabrication process. A convolutional neural network is used on the set of shape data to determine a set of generated shape data, where the convolutional neural network comprises a generator trained with a set of pre-determined discriminators. The set of generated shape data comprises a scanning electron microscope (SEM) image.


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