The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Jul. 16, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Cheng Yu Huang, Hsinchu, TW;

Chun-Hao Chuang, Hsinchu, TW;

Chien-Hsien Tseng, Hsinchu, TW;

Kazuaki Hashimoto, Zhubei, TW;

Keng-Yu Chou, Kaohsiung, TW;

Wei-Chieh Chiang, Yuanlin Township, TW;

Wen-Hau Wu, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2005.12); H01L 23/552 (2005.12); H01L 23/64 (2005.12); H01L 25/04 (2022.12);
U.S. Cl.
CPC ...
H01L 27/14643 (2012.12); H01L 23/552 (2012.12); H01L 23/64 (2012.12); H01L 25/043 (2012.12); H01L 27/14621 (2012.12); H01L 27/14629 (2012.12); H01L 27/14632 (2012.12); H01L 27/14636 (2012.12); H01L 27/1469 (2012.12);
Abstract

In some embodiments, the present disclosure relates to an integrated chip structure. The integrated chip structure includes forming a first image sensor element within a first substrate and a second image sensor element within a second substrate. The first image sensor element is configured to generate electrical signals from electromagnetic radiation within a first range of wavelengths and the second image sensor element is configured to generate electrical signals from electromagnetic radiation within a second range of wavelengths. A plurality of deposition processes are performed to form a band-pass filter over the second substrate. The band-pass filter has a plurality of alternating layers of a first material having a first refractive index and a second material having a second refractive index that is less than the first refractive index. The first substrate is bonded to the band-pass filter.


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