The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2025
Filed:
Aug. 17, 2021
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Bambi L DeLaRosa, Boise, ID (US);
Katya Giannios, Boise, ID (US);
Abhishek Chaurasia, Boise, ID (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2023.12); G06N 3/04 (2022.12); G06T 5/50 (2005.12); G06V 20/69 (2021.12);
U.S. Cl.
CPC ...
G06T 5/70 (2023.12); G06N 3/04 (2012.12); G06T 5/50 (2012.12); G06V 20/695 (2021.12);
Abstract
A machine learning model may be trained to denoise an image. The machine learning model may identify noise in an image of a sequence based at least in part, on at least one other image of the sequence. The machine learning model may include a recurrent neural network. The machine learning model may have a modular architecture including one or more building units. The machine learning model may have a multi-branch architecture. The noise may be identified and removed from the image by an iterative process.