The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2025

Filed:

Jun. 16, 2021
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Mauritius Gerardus Elisabeth Schneiders, Eindhoven, NL;

Koos Van Berkel, Waalre, NL;

Wenjie Jin, Eindhoven, NL;

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2005.12); G06F 17/12 (2005.12);
U.S. Cl.
CPC ...
G03F 7/70266 (2012.12); G03F 7/70504 (2023.04); G03F 7/70508 (2012.12); G03F 7/706 (2012.12); G03F 7/706839 (2023.04); G03F 7/70891 (2012.12); G06F 17/12 (2012.12);
Abstract

A method for calculating a spatial map associated with a component, the spatial map indicating spatial variations of thermal expansion parameters in the component, the method comprising: providing or determining a temperature distribution in the component as a function of time; calculating the spatial map associated with the component using the provided or determined temperature distribution in the component and optical measurements of a radiation beam that has interacted directly or indirectly with the component, the optical measurements being time synchronized with the provided or determined temperature distribution in the component.


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