The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Jun. 25, 2021
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Kameran Azadet, San Ramon, CA (US);

Marc Jan Georges Tiebout, Finkenstein, AT;

Ramon Sanchez, Galapagar MD, ES;

Hazar Yuksel, White Plains, NY (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03F 1/32 (2006.01); H03F 3/21 (2006.01);
U.S. Cl.
CPC ...
H03F 1/3247 (2013.01); H03F 3/21 (2013.01); H03F 2200/129 (2013.01);
Abstract

A system and method for digital correction for a dynamically varying non-linear system. The system includes a correction circuitry including at least one look-up table (LUT). The correction circuitry is configured to receive an input signal and modify the input signal to be processed by the non-linear system using at least one LUT to correct non-linearity incurred by the non-linear system. The at least one LUT is addressed by a magnitude or power of the input signal and a dynamically varying parameter associated with the input signal. The dynamically varying parameter may be one of average signal power of the input signal, a differential of the average power of the input signal, a directional beam index, or temperature.


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