The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2025

Filed:

Dec. 22, 2023
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Vamsi Rayaprolu, San Jose, CA (US);

Ashutosh Malshe, Fremont, CA (US);

Gary Besinga, Boise, ID (US);

Roy Leonard, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01); G11C 16/10 (2006.01); G11C 16/16 (2006.01); G11C 16/26 (2006.01); G11C 16/32 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3495 (2013.01); G11C 16/102 (2013.01); G11C 16/16 (2013.01); G11C 16/26 (2013.01); G11C 16/32 (2013.01);
Abstract

Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising determining a data validity metric value with respect to a set of memory cells of the memory device; responsive to determining that the data validity metric value satisfies a first threshold criterion, performing a data integrity check on the set of memory cells to obtain a data integrity metric value; and responsive to determining that the data integrity metric value satisfies a second threshold criterion, performing an error handling operation on the data stored on the set of memory cells to generate corrected data.


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