The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2025
Filed:
Jul. 13, 2024
Fudan University, Shanghai, CN;
Ran Huang, Shanghai, CN;
Longyan Wu, Shanghai, CN;
Jun Zhu, Shanghai, CN;
Lisheng Tang, Shanghai, CN;
Xinyi Ning, Shanghai, CN;
Xin Ma, Shanghai, CN;
Fudan University, Shanghai, CN;
Abstract
The invention provides a multi-dimensional broad-spectrum clinical in-situ testing equipment designed to evaluate the material properties of plantar soft tissue. The equipment comprises the following features: 1. A testing table with a designated area corresponding to the sole of the foot; 2. A vertical reciprocating stress-strain testing unit mounted on the testing table, for applying vertical tensile and compressive stresses to the plantar and measuring the stress-strain responses; 3. A shear stress-strain testing unit, mounted on the testing table, for applying shear stresses to the plantar and measuring the stress-strain responses; 4. A torque stress-strain detection unit, positioned on the testing stage, for applying torque to the plantar and measuring the stress-strain responses; 5. A lifting mechanism that facilitates the vertical movement of the three testing units. In conclusion, the device is capable of multi-dimensional detection of the mechanical properties of plantar and features a compact structure and easy portability.